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Near-Field Probe Set (3-in-1)
3in1 Near-Field Probe Set is a compact electromagnetic field measurement kit designed for EMC/EMI troubleshooting, RF circuit analysis, PCB debugging, and near-field scanning applications. The kit includes three interchangeable probes optimized for detecting both magnetic (H-Field) and electric (E-Field) emissions from electronic circuits and RF devices.
Designed for use with spectrum analyzers, oscilloscopes, SDRs, and EMI receivers, these probes help engineers quickly locate unwanted radiation sources, identify EMI problems, evaluate shielding effectiveness, and optimize high-speed digital and RF circuit performance.
The lightweight design and SMA interface make the probe set suitable for laboratory, production, field service, and educational applications.
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Kit Includes
- 28 mm H-Field Circular Probe
- 4.5 mm H-Field Circular Probe
- E-Field Probe
- Protective Caps
- SMA Connector Interface
Key Features
- Complete 3-in-1 Near-Field Probe Kit
- Detects Magnetic and Electric Fields
- Ideal for EMC/EMI Pre-Compliance Testing
- Excellent Sensitivity for RF Measurements
- Lightweight and Portable Design
- Interchangeable Probe Types
- Compatible with Spectrum Analyzers
- Compatible with Vector Network Analyzers
- Compatible with SDR Platforms
- Compatible with Oscilloscopes
- 50 Ω SMA Interface
- Durable Flexible Construction
- Easy Plug-and-Play Operation
Applications
- EMC Pre-Compliance Testing
- EMI Source Detection
- RF Circuit Debugging
- PCB Design Validation
- High-Speed Digital Signal Analysis
- Switching Power Supply Noise Detection
- Wireless Device Development
- Antenna Development
- RF Module Testing
- Laboratory Research
- Educational Training
- Production Quality Control
General Specifications
| Parameter | Specification |
|---|---|
| Product Type | Near-Field Probe Kit |
| Number of Probes | 3 |
| Probe Types | H-Field (28 mm), H-Field (4.5 mm), E-Field |
| Connector | SMA Male |
| System Impedance | 50 Ω |
| Application | EMC / EMI Measurement |
| Compatible Instruments | Spectrum Analyzer, Oscilloscope, SDR, EMI Receiver, VNA |
| Construction | Flexible Probe Body |
| Operating Temperature | -20°C to +70°C |
| Storage Temperature | -40°C to +85°C |
What's Included
- 1 × 28 mm H-Field Probe
- 1 × 4.5 mm H-Field Probe
- 1 × E-Field Probe
Individual Product Content
1. 28 mm H-Field Circular Probe
Description
The 28 mm H-Field Circular Probe is designed for measuring magnetic field radiation over a relatively large area. Its larger loop provides higher sensitivity, making it suitable for locating general EMI sources, identifying radiated emissions, and performing rapid PCB scans.
This probe is ideal for initial EMI investigations before switching to smaller probes for pinpoint analysis.
Features
- Large Loop Design
- High Magnetic Field Sensitivity
- Wide Area Scanning
- Ideal for Initial EMI Detection
- SMA Connector
- Flexible Handle
Specifications
| Parameter | Specification |
|---|---|
| Probe Type | H-Field Circular |
| Loop Diameter | 28 mm |
| Connector | SMA Male |
| Impedance | 50 Ω |
| Application | Magnetic Field Measurement |
| Typical Use | Large Area EMI Scanning |
2. 4.5 mm H-Field Circular Probe
Description
The 4.5 mm H-Field Circular Probe provides high spatial resolution for locating specific magnetic field leakage on densely populated PCBs. Its compact sensing loop enables engineers to isolate individual components, traces, switching regulators, and RF circuits with excellent precision.
Ideal for detailed debugging and component-level EMI analysis.
Features
- Small Loop Diameter
- High Spatial Resolution
- Excellent Component-Level Detection
- Low Noise Pickup
- SMA Interface
- Lightweight Design
Specifications
| Parameter | Specification |
|---|---|
| Probe Type | H-Field Circular |
| Loop Diameter | 4.5 mm |
| Connector | SMA Male |
| Impedance | 50 Ω |
| Application | High-Resolution Magnetic Field Measurement |
| Typical Use | PCB-Level EMI Localization |
3. E-Field Probe
Description
The E-Field Probe is designed to measure electric field radiation from PCB traces, connectors, cables, and electronic components. It is particularly effective for identifying capacitive coupling, electric field leakage, and radiated emissions generated by high-speed digital circuits.
Its compact design allows easy access to confined PCB areas while maintaining excellent measurement sensitivity.
Features
- Electric Field Detection
- High Sensitivity
- Compact Design
- SMA Connector
- Ideal for PCB Diagnostics
- Flexible Construction
Specifications
| Parameter | Specification |
|---|---|
| Probe Type | E-Field Probe |
| Connector | SMA Male |
| Impedance | 50 Ω |
| Application | Electric Field Measurement |
| Typical Use | PCB Emission Testing & EMC Diagnostics |
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Near-Field Probe Set (3-in-1)
SKU: MR-NFP3IN1